Location of pattern sensitive memory faults

Abstract

This paper develops the new solution for memory testing based on transparent memory tests in terms of pattern sensitive faults detection. Previous research has outlined that the only march tests can be in use now to test modem memory chips. Their transparent versions are very efficient for the simple fault diagnoses. The solution has been proposed in this paper dealing with extension of know algorithms for the case of pattern sensitive faults. Using the proposed technique it is possible to detect pattern sensitive memory faults with a very high probability. Experimental investigations show the efficiency of the technique for simple faults, as well as for pattern sensitive faults.