Memory testing based on two-dimensional parity

Abstract

This paper presents the new algorithms contents independent testing approaches embedded RAM’s. In this suggested approach the memory in the form of bits matrix is tested. New method based on memory testing in two-dimensional space. Algorithms calculating the memory characteristic and comparing it to the initially computed size of the problem. There is also a dilemma of the reference memory characteristic during the process of memory refreshing and allows to get a high the level of fault coverage with low hardware computer user expects his hardware and stored overhead.